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解説記事

Review articles

IJPEM Review Paper

Ryo Sato, Xinghui Li, Andreas Fischer, Liang-Chia Chen, Chong Chen, Rintaro Shimomura, Wei Gao
Signal Processing and Artificial Intelligence for Dual-Detection Confocal Probes
International Journal of Precision Engineering and Manufacturing, Vol. 25 (2024), pp. 199-223.

IJAT Review Paper

Ryo Sato, Kuangyi Li, Masaki Michihata, Satoru Takahashi, Wei Gao
Advanced sensing and machine learning technologies for intelligent measurement in smart and precision manufacturing
International Journal of Automation Technology, Vol. 18, No. 4 (2024), pp. 545-580.

T. Oiwa, M. Katsuki, J. Fujita, T. Tanaka, K. Furutani, W. Gao, T. Ohashi, K. Sato, and K. Sato
Questionnaire Survey on Ultra-Precision Positioning Technology—10th Questionnaire Survey Report—
International Journal of Automation Technology, Vol. 19, No. 4 (2025), pp. 355-362.

NMME Review Paper

Zinan Li, Zhongyuan Zhang, Weikang Chen, Feng Feng, Xiang Qian, Xiaohao, Wang, Robert X. Gao, Wei Gao, Xinghui Li
A Taxonomy of Deep Learning in Single‑Frame Fringe Projection Profilometry
Nanomanufacturing and Metrology, Vol. 9 (2026), 3.
https://doi.org/10.1007/s41871-025-00285-6

Yuki Shimizu
Laser Interference Lithography for Fabrication of Planar Scale Gratings for Optical Metrology
Nanomanufacturing and Metrology Vol. 4 (2021), 3-27.
https://doi.org/10.1007/s41871-020-00083-2

IJMTM Review Paper

Wei Gao, Soichi Ibaraki, M. Alkan Donmez, Daisuke Kono, J.R.R. Mayer, Yuan-Liu Chen, K´aroly Szipka, Andreas Archenti, Jean-Marc Linares, Norikazu Suzuki
Machine tool calibration: Measurement, modeling, and compensation of machine tool errors
International Journal of Machine Tools and Manufacture, Vol. 187 (2023)

CIRP keynote papers

Albert J. Shih, Wei Gao, Gregory W. Vogl, Dragan Djurdjanovic, Takafumi Fukushima, Ajay Malshe
Innovations in advanced processes and systems for semiconductor manufacturing
CIRP Annals - Manufacturing Technology, Vol. 75 Issue 2 (2026), in press. https://doi.org/10.1016/j.cirp.2026.04.115

Wei Gao, Seung-Woo Kim, Harald Bosse, Kaoru Minoshima
Dimensional metrology based on ultrashort pulse laser and optical frequency comb
CIRP Annals - Manufacturing Technology, Vol. 74 Issue 2 (2025), pp. 993-1018. https://doi.org/10.1016/j.cirp.2025.04.094

Andreas Archenti, Wei Gao, Alkan Donmez, Enrico Savio, Naruhito Irino
Integrated metrology for advanced manufacturing
CIRP Annals-Manufacturing Technology, Vol. 73, (2024), pp. 639-665.

Jose A Yagüe-Fabra, Wei Gao, Andreas Archenti, Edward Morse, Alkan Donmez
Scalability of precision design principles for machines and instruments
CIRP Annals-Manufacturing Technology, Vol. 70, (2021), pp. 659-680.

W. Gao, H. Haitjema, F.Z. Fang, R.K. Leach, C.F. Cheung, E. Savio, J.M. Linares
On-machine and in-process surface metrology for precision manufacturing
CIRP Annals-Manufacturing Technology, Vol. 68, (2019), pp. 843-866.

W. Gao, S.W. Kim, H. Bosse, H. Haitjema, Y.L. Chen, X.D. Lu, W. Knapp, A. Weckenmann, W.T. Estler, H. Kunzmann
Measurement technologies for precision positioning
CIRP Annals-Manufacturing Technology, Vol. 64, (2015), pp. 773-796.

J.M. Linares, G. Goch, A.Forbes, J.M. Sprauel, A. Clément, F.Haertig, W. Gao
Modelling and traceability for computationally-intensive precision engineering and metrology
CIRP Annals-Manufacturing Technology, Vol. 67, (2018), pp. 815-838.

F.Z.Fang, X.D.Zhang, W.Gao, Y.B.Guo, G.Byrne, H.N.Hansen
Nanomanufacturing—Perspective and applications
CIRP Annals-Manufacturing Technology, Vol. 66, (2017), pp. 683-705.

Abhijit Chandra, Grant Anderson, Shreyes Melkote, Wei Gao, Han Haitjema, Konrad Wegener
Role of surfaces and interfaces in solar cell manufacturing
CIRP Annals-Manufacturing Technology, Vol. 63, (2014), pp. 797-819.

精密工学会誌解説記事 (Review articles of Journal of JSPE)

その他の解説記事 (Other Review articles)

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