Original Papers 2010

---

1. A Simple Technique for Measuring Thickness Distribution of Transparent Plates From a Single Image by Using the Sampling Moiré Method [Meas. Sci. Technol. 21 (Issue 2), (2010), 025305 (8pages)]
   S. Ri and T. Muramatsu
   
   
2. Sampling Moiré Method for Accurate Small Deformation Distribution Measurement [Exp. Mech. 50 (Issue 4), (2010), 501 - 508]
   S. Ri, M. Fujigaki and Y. Morimoto
   
   
3. An Integrated Compact Unit for Wide Range Micro-Newton Force Measurement [J. Solid Mech. Mater. Eng., 4 (4), (2010), 545 - 556]
   M.A.S. Akanda, H. Tohmyoh and M. Saka
   
   
4. Controlling Ag Whisker Growth by Using Very-Thin Metallic Films [Scripta Mater., 63 (Issue 3), (2010), 289 - 292]
   H. Tohmyoh, M. Yasuda and M. Saka
   
   
5. Simulation of Nanostructure Production by Electromigration Considering Specimen's Shape [J. Nanosci. Nanotechnol., 10 (9), (2010), 6036 - 6040]
   K. Sasagawa, A. Kirita, S. Fukushi and M. Saka
   
   
6. Evaluation of the Dominant Factor for Electromigration in Sputtered High Purity Al Films [Trans. ASME, J. Electron. Packaging, 132 (2), (2010), 021003-1 - 021003-9]
   X. Zhao, M. Saka, M. Yamashita and F. Togoh
   
   
7. Checking Surface Contamination and Determination of Electrical Resistivity of Oxide Scale Deposited on Low Carbon Steel by DC Potential Drop Method [Mater. Trans., 51 (8), (2010), 1414 - 1419]
   Md. Rostom Ali, M. Saka and H. Tohmyoh
   
   
8. Evaluation of Electrical Resistivity of Oxide Scale Formed under Different Conditions [J. Solid Mech. Mater. Eng., 4 (12), (2010), 1732 - 1741]
   M.R. Ali, M. Saka, H. Tohmyoh and M.A.S. Akanda
   
   

---

Back
Top page