Original Papers 2003
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Derivation of Film Characteristics and Prediction of Electromigration Failure in Passivated Polycrystalline Line [Advances Metallization Conference 2002, MRS, (2003), 291 - 296]
K. Sasagawa, M. Hasegawa, M. Saka and H. Abé
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Recrystallization-Etch Observation of Plastic Deformation Caused by Cavitation Shotless Peening
[Journal of Materials Science Letters, 22 (2), (2003), 115 - 117]
D. O. Macodiyo, H. Soyama and M. Saka
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Development of a Millimeter Wave Compact Equipment for NDT of Materials
[International Journal of Infrared and Millimeter Waves, 24 (3), (2003), 391 - 397]
Y. Ju, Y. Hirosawa, M. Saka and H. Abé
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Microwave Measurement of the Conductivity of Conducting Thin Films [Optics and Precision Engineering, 11 (1), (2003), 59 - 61]
Y. Ju, Y. Hirosawa and M. Saka
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Determination of Inclusions in Steel Sheet by Ultrasonic Probe in Detecting Near Surface Flaws [Journal of JSNDI, 52 (6), (2003), 297 - 302]
H. Yamamoto, Y. Takishita and M. Saka
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Dry-Contact Technique for High-Resolution Ultrasonic Imaging [IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 50 (6), (2003), 661 - 667]
H. Tohmyoh and M. Saka
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Cavitation Shotless Peening for Surface Modification of Alloy Tool Steel
[JSME International Journal (A), 46 (3), (2003), 398 - 402]
H. Soyama, K. Sasaki, D. O. Macodiyo and M. Saka
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Contactless Measurement of Thin Film Conductivity by a Microwave Compact Equipment [International Journal of Modern Physics B, 17 (8&9), (2003), 1904 - 1909]
Y. Ju, Y. Hirosawa, M. Saka and H. Abé
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Expression of a Governing Parameter for Electromigration Damage on Metal Line Ends [
Proc. of IPACK03, International Electronic Packaging Technical Conference and Exhibition, July 6-11, 2003, Maui, Hawaii, USA (CD-ROM)]
M. Hasegawa, K. Sasagawa, M. Saka and H. Abé
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Prediction of Electromigration Failure in Passivated Polycrystalline Line Considering Passivation Thickness [
Proc. of IPACK03, International Electronic Packaging Technical Conference and Exhibition, July 6-11, 2003, Maui, Hawaii, USA (CD-ROM)]
K. Sasagawa, M. Hasegawa, N. Yoshida, M. Saka and H. Abé
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Microwave Imaging of Conductivity Distribution of Silicon Wafers [
Proc. of IPACK03, International Electronic Packaging Technical Conference and Exhibition, July 6-11, 2003, Maui, Hawaii, USA (CD-ROM)]
Y. Ju, M. Saka and H. Abé
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Nondestructive Inspection of Chip Size Package by Millimeter Waves [
Proc. of IPACK03, International Electronic Packaging Technical Conference and Exhibition, July 6-11, 2003, Maui, Hawaii, USA (CD-ROM)]
Y. Ju, H. Yamamoto and M. Saka
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A High-Resolution Dry-Contact Acoustic Imaging of the Solder Joints for Ball Grid Array Assembly [
Proc. of IPACK03, International Electronic Packaging Technical Conference and Exhibition, July 6-11, 2003, Maui, Hawaii, USA (CD-ROM)]
H. Tohmyoh and M. Saka
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A Method of the Measurement of Moisture in IC Packages Using Microwaves
[IEEE Transactions on Electronics Packaging Manufacturing, 26 (3), (2003), 228 - 231]
Y. Ju, M. Saka and H. Abé
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Quantitative Evaluation of Moisture in Encapsulant Resin of IC Packages by Microwaves [Proc. of ATEM'03, Int. Conf. on Advanced Technology in Experimental Mechanics 2003, September 10-12, 2003, Nagoya (CD-ROM)]
Y. Ju, Y. Ohno, M. Saka and H. Abé
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An Effective Transmission Technique of Higher Frequency Ultrasound into a Wafer Level Package [Proc. of ATEM'03, Int. Conf. on Advanced Technology in Experimental Mechanics 2003, September 10-12, 2003, Nagoya (CD-ROM)]
Y. Tohmyoh and M. Saka
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Effect of Ar Gas Pressure on Growth, Structure, and Mechanical Properties of Sputtered Ti Thin Films [Proc. of ATEM'03, Int. Conf. on Advanced Technology in Experimental Mechanics 2003, September 10-12, 2003, Nagoya (CD-ROM)]
H. Ogawa, S. Kaneko, K. Suzuki and M. Saka
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Improvement of Fatigue Strength on Duralumin by Cavitation Shotless Peening [Proc. of ATEM'03, Int. Conf. on Advanced Technology in Experimental Mechanics 2003, September 10-12, 2003, Nagoya (CD-ROM)]
D. O. Macodiyo, H. Soyama, K. Saito and M. Saka
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A Dry-Contact Method for Transmitting Higher Frequency Components of Ultrasound
[International Journal of Applied Electromagnetics and Mechanics, 18 (1-3), (2003), 31 - 39]
H. Tohmyoh and M. Saka
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Sensitive Ultrasonic Testing of a Small Closed Crack
[Strength, Fracture and Complexity, 1 (2), (2003), 89 - 99]
M. A. S. Akanda and M. Saka
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